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ADuM5230
POWER CONSUMPTION
The power converter in the ADuM5230 provides 13 mA of
power to the secondary in its default configuration. Power is
provided to both the data channel, V OA , and the V ISO pin for off-
chip use. Current consumption of V OA varies with frequency as
shown in Figure 8. The maximum available power for external
use decreases as the frequency of the data channel increases to
stay within the total available current.
INCREASING AND DECREASING AVAILABLE POWER
The V ADJ pin is used to increase or decrease the available power
at the V ISO pin. This allows the increase of the V ISO voltage for a
given load or the increase of the maximum V ISO load. Alternatively,
power can also be reduced when it is not required at the output,
lowering the quiescent current and saving power.
Power adjustment is accomplished by adding a voltage divider
between V ADJ , V DD1 , and GND, as shown in Figure 25. Under
normal operation, the V ADJ pin is left open, allowing the internal
bias network to set the duty factor of the internal PWM. If the
V ADJ pin is connected via a resistor divider, a duty factor other
than the default can be chosen. The relationship between the
duty factor of the internal PWM and the available power under
Data Sheet
load is shown in Figure 13. When the desired duty factor is
chosen, the values of the upper and lower divider resistors can
be chosen as shown in Figure 14, which assumes a 10 kΩ total
divider resistance.
COMMON-MODE TRANSIENT IMMUNITY
In general, common-mode transients consist of linear and
sinusoidal components. The linear component of a common-
mode transient is given by
V CM, linear = (Δ V /Δ t ) t
where Δ V /Δ t is the slope of the transient shown in Figure 19
and Figure 20.
The transient of the linear component is given by
dV CM / dt = Δ V /Δ t
The ability of the ADuM5230 to operate correctly in the
presence of linear transients is characterized by the data in
Figure 22. The data is based on design simulation and is the
maximum linear transient magnitude that the ADuM5230 can
tolerate without an operational error. This data shows a higher
level of robustness than what is shown in Table 1 because the
transient immunity values obtained in Table 1 use measured
data and apply allowances for measurement error and margin.
15V
V DD1
GND 1
V ISO AND V DDB
5V
15V
15V
? V
GND ISO AND GND B
V ISO AND V DDB
GND ISO AND GND B
V DD1
5V
? t
? V
? t
15V
GND 1
Figure 19. Common-Mode Transient Immunity Waveforms—Input to Output
15V
V ISO /V DDB
GND B /GND B
V ISO /V DDB
15V
15V
15V
? V
GND ISO /GND B
V ISO /V DDB
GND ISO /GND B
V ISO /V DDB
15V
? t
? V
? t
15V
GND B /GND B
Figure 20. Common-Mode Transient Immunity Waveforms—Between Outputs
V ISO /V DDB
? V DD
? t
V ISO /V DDB
GND ISO /GND B
GND ISO /GND B
Figure 21. Transient Immunity Waveforms—Output Supplies
Rev. B | Page 12 of 16
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